The principle of statistical process control is introduced and the damage identification process using Xbar-R chart is derived.

介绍了统计过程控制原理，推导了均值极差控制图进行结构连 续损伤识别的过程；

Use Xbar and R charts to discover the factors that contribute to process variability. Shewhart charts cannot ensure against accepting poor or recallable lots.

它揭示了引起制程变异的因素，但不能确定是否允收一个有可能不良的批次。